@INCOLLECTION{kern_01b,
  author =       {Niemeier, Wolfgang and Kern, Fredie},
  title =        {Anwendungspotentiale von scannenden Meßverfahren},
  booktitle =    {Von Handaufmaß bis High Tech},
  publisher =    {Verlag Philipp von Zabern},
  year =         {2001},
  editor =       {Weferling, U. and Heine, K. and  Wulf, U.},
  pages =        {134-140 u. Anhang VII},
  address =       {Mainz},
  file = F
}